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| + | |||
| + | == jersey city news == | ||
| + | |||
| + | |||
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| + | ch_width = 675; | ||
| + | ch_height = 200; | ||
| + | ch_sid = "Article Alley Articles North MPU"; | ||
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| + | ch_type = "mpu"; | ||
| + | ch_hq = 1; | ||
| + | |||
| + | Tag:apparatus instrument???Credence Unveil???the Diamond Test Platform | ||
| + | From:/ | ||
| + | Industry-Leading Channel Density Enables Larger Multisite Counts, Allowing Higher Throughput for Customers Without Adding More Test Cells on the Production Floor | ||
| + | Credence Systems Corporation (NASDAQ: CMOS), a provider of automated test equipment (ATE) solutions for the worldwide semiconductor industry, unveiled the latest addition to its family of value-driven instruments for the Diamond test platform. The 72-channel HDVI (High Density Voltage/Current) instrument is targeted at significantly reducing the cost of test by enabling large numbers of sites to be tested in parallel. The HDVI instrument's high-precision source and measurement capability is ideal for testing microcontrollers, audio, video, wireless cellular, digital camera, baseband and power management devices used in a broad range of cost-sensitive applications. | ||
| + | The industry-leading V/I channel count of the HDVI -- up to 432 channels on the Diamond 10, and 1728 channels on the Diamond 40 -- results in significantly lower cost-per-channel. It also helps to free up more instrument slots in the tester, thereby enabling larger multisite configurations. When combined with the Diamond platform's other high-density instruments, HDVI increases <strong>[http://vintagejerseys9.webs.com vintage jerseys]</strong> the capacity of each test system and consequently reduces the number of test cells needed on the production floor. At the same time, throughput is dramatically increased by the high degree of parallel test capability. | ||
| + | "Our customers continue to face intense price pressures, which is driving higher-count multisite testing for cost of test and throughput improvements. SoC/SiP devices are also growing more complex through increasing integration of features, placing greater pin-count and test coverage demands on ATE," stated Amir Aghdaei, senior vice president of field operations and marketing at Credence. "Clearly, acquisition costs and operational efficiency of the test system have become especially critical. With the addition of the HDVI instrument, the Diamond platform can cost-effectively test higher site counts without additional capex demand, helping our customers to stay on top of rising demand and falling ASPs and thus meet profitability goals." | ||
| + | ch_client = "articlealley"; | ||
| + | ch_width = 675; | ||
| + | ch_height = 200; | ||
| + | ch_sid = "Article Alley Articles North MPU"; | ||
| + | ch_cid = "north"; | ||
| + | ch_type = "mpu"; | ||
| + | ch_hq = 1; | ||
| + | |||
| + | Diamond HDVI Instrument: Technology Summary | ||
| + | The HDVI instrument enables efficient use of test head resources (slots) via a broad range of functionality and innovative features that <strong>[http://lakerjerseys.webs.com laker jerseys]</strong> traditionally required multiple V/I options on other platforms. The HDVI contains 72 channels that can be operated in one of two modes: (1) Voltage/Current Supply (VIS) and (2) Precision Analog Source (PAS). The VIS mode offers 72 channels of general purpose, four-quadrant V/I capability for up to +/-7V and a maximum of +/-2A. In the PAS mode, each channel is capable of sourcing user-defined analog waveforms with very high accuracy for driving analog inputs of microcontrollers and embedded ADCs to perform INL and DNL tests. | ||
| + | Key HDVI features and benefits: | ||
| + | -- Industry-leading V/I channel density delivers best throughput and | ||
| + | parallel test efficiency. | ||
| + | -- Built-in, <strong>[http://jerseysall.webs.com jerseys all]</strong> high-bandwidth input matrix allows external instruments to | ||
| + | connect <strong>[http://lalakerjerseys.webs.com la laker jerseys]</strong> to multi-use DUT pins and eliminate loadboard <strong>[http://goalkeeperjerseys.webs.com goalkeeper jerseys]</strong> components. | ||
| + | -- Trigger control for source and measure memory <strong>[http://wholesalejerseys999.webs.com whole sale jerseys]</strong> synchronizes operation | ||
| + | with tester or DUT events. | ||
| + | -- High-current performance on large number of pins provides coverage for | ||
| + | the growing embedded power management features in battery-driven consumer | ||
| + | products. | ||
| + | -- High-accuracy voltage ( | ||
| + | measurements enable reliable testing of sensitive reference pins. | ||
| + | |||
| + | 相关的主题文章: | ||
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| + | <li>[http://bodla.org/index.php/User:Jackikenac8f#new_jersey_white_pages new jersey white pages]</li> | ||
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Latest revision as of 14:35, 3 July 2013
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Tag:apparatus instrument???Credence Unveil???the Diamond Test Platform From:/ Industry-Leading Channel Density Enables Larger Multisite Counts, Allowing Higher Throughput for Customers Without Adding More Test Cells on the Production Floor Credence Systems Corporation (NASDAQ: CMOS), a provider of automated test equipment (ATE) solutions for the worldwide semiconductor industry, unveiled the latest addition to its family of value-driven instruments for the Diamond test platform. The 72-channel HDVI (High Density Voltage/Current) instrument is targeted at significantly reducing the cost of test by enabling large numbers of sites to be tested in parallel. The HDVI instrument's high-precision source and measurement capability is ideal for testing microcontrollers, audio, video, wireless cellular, digital camera, baseband and power management devices used in a broad range of cost-sensitive applications. The industry-leading V/I channel count of the HDVI -- up to 432 channels on the Diamond 10, and 1728 channels on the Diamond 40 -- results in significantly lower cost-per-channel. It also helps to free up more instrument slots in the tester, thereby enabling larger multisite configurations. When combined with the Diamond platform's other high-density instruments, HDVI increases vintage jerseys the capacity of each test system and consequently reduces the number of test cells needed on the production floor. At the same time, throughput is dramatically increased by the high degree of parallel test capability. "Our customers continue to face intense price pressures, which is driving higher-count multisite testing for cost of test and throughput improvements. SoC/SiP devices are also growing more complex through increasing integration of features, placing greater pin-count and test coverage demands on ATE," stated Amir Aghdaei, senior vice president of field operations and marketing at Credence. "Clearly, acquisition costs and operational efficiency of the test system have become especially critical. With the addition of the HDVI instrument, the Diamond platform can cost-effectively test higher site counts without additional capex demand, helping our customers to stay on top of rising demand and falling ASPs and thus meet profitability goals." ch_client = "articlealley"; ch_width = 675; ch_height = 200; ch_sid = "Article Alley Articles North MPU"; ch_cid = "north"; ch_type = "mpu"; ch_hq = 1;
Diamond HDVI Instrument: Technology Summary The HDVI instrument enables efficient use of test head resources (slots) via a broad range of functionality and innovative features that laker jerseys traditionally required multiple V/I options on other platforms. The HDVI contains 72 channels that can be operated in one of two modes: (1) Voltage/Current Supply (VIS) and (2) Precision Analog Source (PAS). The VIS mode offers 72 channels of general purpose, four-quadrant V/I capability for up to +/-7V and a maximum of +/-2A. In the PAS mode, each channel is capable of sourcing user-defined analog waveforms with very high accuracy for driving analog inputs of microcontrollers and embedded ADCs to perform INL and DNL tests. Key HDVI features and benefits: -- Industry-leading V/I channel density delivers best throughput and
parallel test efficiency.
-- Built-in, jerseys all high-bandwidth input matrix allows external instruments to
connect la laker jerseys to multi-use DUT pins and eliminate loadboard goalkeeper jerseys components.
-- Trigger control for source and measure memory whole sale jerseys synchronizes operation
with tester or DUT events.
-- High-current performance on large number of pins provides coverage for
the growing embedded power management features in battery-driven consumer products.
-- High-accuracy voltage (
measurements enable reliable testing of sensitive reference pins.
相关的主题文章: